Personnel Information

写真b

SASAGAWA KAZUHIKO


Title

Professor

Field of expertise (Grants-in-aid for Scientific Research classification) 【 display / non-display

  • Materials/Mechanics of materials

 

Papers 【 display / non-display

  • English, Expression of a Governing Parameter for Electromigration Damage on Metal Line Ends, Proc. of InterPACK '03(CD-ROM), The Pacific Rim/ASME International Electronic Packaging Technical Conference & Exhibition, ASME, Maui, Hawaii, USA, July 6-11, 2003, (2003-7-6), InterPack2003-35064, 2003.07, M. Hasegawa, K. Sasagawa, M. Saka and H. Ab?

    Research paper (international conference proceedings), Joint Work

  • English, Prediction of Electromigration Failure in Passivated Polycrystalline Line Considering Passivation Thickness, Proc. of InterPACK '03(CD-ROM), The Pacific Rim/ASME International Electronic Packaging Technical Conference & Exhibition, ASME, Maui, Hawaii, USA, July 6-11, 2003, (2003-7-6), InterPack2003-35065, 2003.07, K. Sasagawa, M. Hasegawa, N. Yoshida, M. Saka and H. Ab?

    Research paper (international conference proceedings), Joint Work

  • English, Evaluation Method of the Threshold Current Density for Electromigration Damage in IC Metal Lines, The Second Japan-Taiwan Workshop on Mechanical and Aerospace Engineering, Tokyo Institute of Technology & Tohoku University (2003-10/17-20, Tokyo), 129 - 137, 2003.10, M. Hasegawa, K. Sasagawa and M. Saka

    Research paper (international conference proceedings), Joint Work

  • English, Derivation of the Film Characteristic Constants Using the Governing Parameter for Electromigration Damage at Metal Line Ends, Proc. of ISMME2003, The International Symposium on Micro-Mechanical Engineering―Heat Transfer, Fluid Dynamics, Reliability and Mechatronics―, JSME, Tsuchiura, Japan, December 1-3, 2003, (2003-12-1), 433 - 439, 2003.12, M. Hasegawa, K. Sasagawa, S. Uno and M. Saka

    Research paper (international conference proceedings), Joint Work

  • English, Derivation of Film Characteristic Constants of Polycrystalline Line for Reliability Evaluation against Electromigration Failure, 2004 ASME International Mechanical Engineering Congress & Exposition, ASME, Nov. 13-19, 2004, Anaheim, USA, paper ID IMECE2002-60620, 2004.11, M. Hasegawa, K. Sasagawa, S. Uno, M. Saka and H. Ab?

    Research paper (international conference proceedings), Joint Work

display all >>

Books 【 display / non-display

  • English, Metallic Micro and Nano Materials - Fabrication with Atomic Diffusion , Springer, 2011.01, M. Saka, K. Sasagawa, M. Muraoka, H. Tohmyoh and Y. Ju

    Scholarly Book, Joint Work

Review Papers 【 display / non-display

  • Japanese, Evaluation of Stresses in Human Body, vol.62 (p.515 - 521) , 2013.10

    Introduction and explanation (scientific journal), Joint Work