Personnel Information

写真a

Toshiki Kanamoto


Title

Professor

Homepage URL

http://www.eit.hirosaki-u.ac.jp/~kana

Academic Society Affiliations 【 display / non-display

  • JEITA

  • IPSJ

  • IEICE

  • IEEE

Field of expertise (Grants-in-aid for Scientific Research classification) 【 display / non-display

  • Electron device/Electronic equipment

 

Papers 【 display / non-display

  • English, Supply Noise Suppression by Triple-Well Structure , IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol.21 (4) (p.781 - 785) , 2013.04, Yasuhiro Ogasahara, Masanori Hashimoto,Toshiki Kanamoto, Takao Onoye

    Research paper (scientific journal), Multiple Authorship, Electron device/Electronic equipment

  • English, Resistivity-based modeling of substrate non-uniformity for low-resistivity substrate, IEICE Electronics Express, vol.11 (3) (p.20130813) , 2014.04, Kanamoto Toshiki, Inaba Hisato, Chiba Toshiharu, Ogasahara Yasuhiro

    Research paper (scientific journal), Multiple Authorship, Electron device/Electronic equipment

  • English, Structure optimization for timing in nano scale FinFET, IEICE Electronics Express, vol.12 (9) (p.20150297) , 2015.04, Kanamoto Toshiki, Akamine Takeichiro, Ammo Hiroaki, Hasegawa Takashi, Shimizu Kouhei, Kumano Yoshinori, Kawano Masaharu, Kurokawa Atsushi

    Research paper (scientific journal), Multiple Authorship, Electron device/Electronic equipment

  • English, Accurate prediction of interconnect capacitance in Self-Aligned Quadruple Patterning, 2016 IEEE 20th Workshop on 2016 IEEE 20th Workshop, 2016.05, T. Kanamoto, H. Ammo, T. Hasegawa, S. Kobayashi, T. Fukuda and M. Kawano

    Research paper (international conference proceedings), Multiple Authorship, Electron device/Electronic equipment

  • English, A new EMI-noise reduction method in LSI-Package-Board system , 2016 IEEE 20th Workshop on Signal and Power Integrity (SPI), 2016.05, Takashi Hasegawa, Toshiki Kanamoto, Hiroaki Ammo, Masaharu Kawano, Toshikazu Fukuda, Sachiko Kobayashi, Atsushi Kurokawa

    Research paper (international conference proceedings), Multiple Authorship, Electron device/Electronic equipment

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